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X-ray fluorescence (XRF)
Description
State of the art wavelength-dispersive spectrometer for elemental analysis under vacuum or helium. Qualitative and quantitative elemental analysis on hard metals or ceramic samples.
Themes
Physical Testing
Chemical analysis
Technical expert
Other equipment of the technical expert
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Combustion analysis
Measurement of oxygen, nitrogen, carbon and sulphur contents Oxygen, nitrogen, carbon or sulphur determination in metals, carbides, ceramics and alloys. Free carbon in tungsten carbide powder.
Corrosion
Corrosion cell. Study of corrosion phenomena by electrochemical analysis on sintered samples in different media and temperatures.
Density, Absolute (Skeletal)
Gas displacement pycnometry system
Glow discharge spectrometry
State of the art spectrometer with a RF-source to provide fast, simultaneous analysis of elements including hydrogen, oxygen, carbon, nitrogen and chlorine in deep UV. Qualitative and quantitative...
Grain size measurement by Fisher
"Manual Fisher Sub-Sieve Sizer and his improved successor a H.E.L. Subsieve AutoSizer (SAS) based on air-permeability technique. Determine average particle size of powders in the range of 0.2 to 75...
ICP Optical Emission Spectroscopy
High-resolution spectrometer with lowest detection limits using single view radial plasma Quantitative trace elements analysis in raw materials (i.e. impurities), water, oil suspensions or volatile...
Particle size distribution
Grain size distribution measurement by laser diffraction. Determine grain size distribution of: · Raw material · RTP Measurements can be made in liquid or dry mode
Raman microscope
Raman microscope to allow fast, non-destructive chemical micro-analysis and automated high definition, fully confocal, Raman chemical imaging. Characterisation of: Organic additives, Carbon based...
Scanning electron microscope (SEM)
W-cathode SEM: Capable of varying pressure with a large specimen chamber combined with an EDS spectrometer for analytical purpose. Field Emission SEM equipped with a Schottky electron gun for...
Special SEM preparation
Ion beam cross section polisher Argon-ion beam polishing of specimens for SEM applications including EBSD.
Surface area
Multipoint powder surface area analyser based on gas sorption process. Determine BET down to 0.01 m2/g
Thermal analysis
Different state of the art equipment: · Thermogravimetric and differential thermal analysis from RT up to 1600°C coupled with a Mass spectrometer · Thermomechanical analysis from RT...
X-ray analytical microscope
X-ray micro-analyser to perform non-destructive elemental analysis from Na to U with an energy dispersive fluorescence. Automated sample scanning provides image of elemental distribution....
X-ray diffraction (XRD)
State of the art X-ray diffraction equipment equipped with sample changer, cradle and a high temperature chamber which can be used up to 1200°C under high vacuum or controlled atmospheres. Possible...
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