W-cathode SEM:
Capable of varying pressure with a large specimen chamber combined with an EDS spectrometer for analytical purpose.
Field Emission SEM equipped with a Schottky electron gun for analytical applications (EDS, WDS, EBSD).
Imaging of:
· Powders,
· Bulk material,
· Coatings and
· Studies of defects by secondary electron and backscattered electron imaging.
Quantitative and qualitative analysis:
· Elemental distribution by EDS (Energy Dispersive X-ray Spectrometry) or by WDS (Wavelength Dispersive X-ray Spectrometry)
· Linescans by EDS or WDS
· Phases identification,
· Phase distribution,
· Grain size distribution,
· Texture characterization (IPF-map, Pole figures, inverse Pole figures, ODF)
