State of the art X-ray diffraction equipment equipped with sample changer, cradle and a high temperature chamber which can be used up to 1200°C under high vacuum or controlled atmospheres. Possible materials: Powders, bulk materials, thin films. Analysis: Phases identification,Rietveld analysis, Lattice strain and crystallite size determination, Stress measurement at room or high temperature,exture analysis (Pole figures, inverse Pole figures, ODF).
